Cerva, Han: search on Z-Library

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1

Defects Below Mask Edges in Silicon Induced by Amorphizing Implantations

Journal:

Defect and Diffusion Forum

Year:

1997

Language:

english

File:

PDF, 2.32 MB

english, 1997

2

Identification of Microdefects Induced in Si after Hydrogen and Helium Plasma Treatments

Singh, M., Weber, Joerg, Zundel, T., Konuma, M., Cerva, Hans

Journal:

Materials Science Forum

Year:

1989

File:

PDF, 306 KB

1989

3

Interfacial layers and their effect on leakage current in mocvd-deposited SBT thin films

Bachhofer, Harald, Reisinger, Hans, Steinlesberger, Gernot, Schroeder, Herbert, Nagel, Nicolas, Mdcolajick, Thomas, Cerva, Hans, Philipsborn, Henning Von, Waser, Rainer

Journal:

Integrated Ferroelectrics

Year:

2001

Language:

english

File:

PDF, 509 KB

english, 2001

4

High-resolution electron microscopy of diamond hexagonal silicon in low pressure chemical vapor deposited polycrystalline silicon

Journal:

Journal of Materials Research

Year:

1991

Language:

english

File:

PDF, 20.13 MB

english, 1991

5

Microstructure and Crystal Structure of Bismuth Oxide Phases in Zinc Oxide Varistor Ceramics

HANS CERVA, WINFRIED RUSSWURM

Journal:

Journal of the American Ceramic Society

Year:

1988

Language:

english

File:

PDF, 1.23 MB

english, 1988

6

Properties of SrBi 2 Ta 2 O 9 thin films grown by MOCVD for high density FeRAM applications

Hintermaier, Frank, Hendrix, Bryan, Desrochers, Debra, Roeder, Jeffrey, Baum, Thomas, Buskirk, Peter Van, Bolten, Dirk, Grossmann, Michael, Lohse, Oliver, Schumacher, Marcus, Waser, Rainer, Cerva, Han

Journal:

Integrated Ferroelectrics

Year:

1998

Language:

english

File:

PDF, 720 KB

english, 1998

7

Chemical Composition and Characterization of the Si/C Interface in Poly-Si Thin Films on Graphite Substrates

Reindl, T., Fuska, T., Walz, C., Cerva, Hans, Lemme, R., Weitzel, C., Kruehler, W., Pauli, M., Mueller, Johannes

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 490 KB

1996

8

Influence of Overgrown Micropipes in the Active Area of SiC Schottky Diodes on Long Term Reliability

Rupp, Roland, Treu, Michael, Türkes, Peter, Beermann, H., Scherg, Thomas, Preis, Herbert, Cerva, Hans

Journal:

Materials Science Forum

Year:

2005

Language:

english

File:

PDF, 450 KB

english, 2005

9

[IEEE 2006 1st Electronic Systemintegration Technology Conference - Dresden, Germany (2006.09.5-2006.09.7)] 2006 1st Electronic Systemintegration Technology Conference - Accident Analysis to Avoid PPM Peaks on Purchased Semiconductors Components

Kleyna, Reinhard, Cerva, Hans, Franke, Martin, Kiening, Matthias, Muench, Rolf

Year:

2006

Language:

english

File:

PDF, 6.29 MB

english, 2006

10

New Relaxation Mechanism in Short Period Si/Ge Strained-Layer Superlattices

Wegscheider, Werner, Eberl, Karl, Abstreiter, Gerhard, Cerva, Hans, Oppolzer, Helmut

Journal:

MRS Proceedings

Year:

1990

Language:

english

File:

PDF, 3.93 MB

english, 1990

11

Defects and Contamination in Microelectronic Device Production: State-of-the-Art and Prospects

Kolbesen, Bernd O., Cerva, Hans, Zoth, G.

Journal:

Solid State Phenomena

Year:

2001

File:

PDF, 555 KB

2001

12

[ECS Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007) - Munich, Germany (September 13 - September 14, 2007)] ECS Transactions - Application of Selected Electron Microscopy Methods to Materials Analysis Problems

Rucki, Andreas, Cerva, Hans

Year:

2007

Language:

english

File:

PDF, 1.27 MB

english, 2007

13

[ECS Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007) - Munich, Germany (September 13 - September 14, 2007)] ECS Transactions - Organic Peracid Etches: A New Class of Chromium Free Etch Solutions for the Delineation of Defects in Different Semiconducting Materials

Possner, Daniel, Kolbesen, Bernd O., Cerva, Hans, Kluppel, V

Year:

2007

Language:

english

File:

PDF, 1.08 MB

english, 2007

14

Comparison of Growth and Strain Relaxation of Si/Ge Superlattices Under Compressive and Tensile Strain Field

Wegscheider, Werner, Eberl, Karl, Abstreiter, Gerhard, Cerva, Hans, Oppolzer, Helmut

Journal:

MRS Proceedings

Year:

1991

Language:

english

File:

PDF, 3.42 MB

english, 1991

15

High-Resolution Electron Microscopy of Process-Induced Defects in Silicon

Cerva, Hans, Oppolzer, Helmut

Journal:

MRS Proceedings

Year:

1990

Language:

english

File:

PDF, 10.02 MB

english, 1990

16

On the role of nanocavities in suppressing boron transient enhanced diffusion and deactivation in F[sup +] coimplanted silicon

Giles, Luis Felipe, Stapelmann, Chris, Cerva, Hans, Jahnel, Franz, Demeurisse, Caroline, Vrancken, Christa, Hoffmann, Thomas

Journal:

Journal of Applied Physics

Year:

2008

Language:

english

File:

PDF, 1.28 MB

english, 2008

17

Two-dimensional delineation of shallow junctions in silicon by selective etching of transmission electron microscopy cross sections

Journal:

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures

Year:

1992

Language:

english

File:

PDF, 937 KB

english, 1992

18

Interaction of Point Defects with Dislocations in Silicon and Germanium: Electrical and Optical Effects

Schröter, Wolfgang, Cerva, Hans

Journal:

Solid State Phenomena

Year:

2002

Language:

english

File:

PDF, 4.73 MB

english, 2002

19

Process-Induced Defects in Silicon Technology

Kolbesen, Bernd O., Dellith, M., Booker, R., Cerva, Hans, Gelsdorf, F., Bergholz, Werner

Journal:

Solid State Phenomena

Year:

1993

Language:

english

File:

PDF, 990 KB

english, 1993

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